Technical Presentations and Division Reports from Annual Meetings

 

October 12-13, 2018 Lake George, NY

Technical Program

Estimating Uncertainty due to Stray Light in Spectroradiometric LED Measurements – Jim Leland, Copia, LLC

Vision Experiment on CIE 2015 Cone-Fundamental-based 10° Color Matching Functions for Lighting Applications – Yoshi Ohno, NIST & Semin Oh, UNIST, Korea

CIE Technical Committee 1-93, Calculation of Self-luminous Neutral Scale – Rob Carter, US Navy (Retired)

Quantifying Perceived Chroma Changes of Illuminated Objects due to the Hunt Effect – Yuki Kawashima & Yoshi Ohno, NIST

CIE JT69, CIE System for Metrology of Optical Radiation for ipRGC-Influenced Responses to Light – David Sliney, Consulting Medical Physicist

Panel discussion on Radiation and the Eyes: UV, Blue, and Beyond

Blue Light – Karl Citek, Pacific University College of Optometry

Light and Myopia – Alan Lewis, Consultant in Physiological Optics

Retinal Phototoxicity, BlueLight & AMD – David Sliney, Consulting Medical Physicist

CIE Division Reports

CIE Division 1 Report

CIE Division 3 Report

CIE Division 4 Report

CIE Division 6 Report

October 6-7, 2014 Technical Presentations

Yoshi Ohno (NIST), Vision Experiments on the effects of chroma saturation on general color preference of lighting

Alan Lewis (New England College of Optometry), EZ-ID – A Proposed Method of Improving Visibility and Recall of License Plate Numbers

Yuqin Zong (NIST), Recent Progress on Optical Metrology for Solid-State Lighting at NIST

Daniel Salinas (Lighting System Designer), How Lighting Specifiers Use the Lighting Information Generated from Test Method Standards (no presentation)

Ron Gibbons (VTTI), Building the Relationship Between Roadway Lighting and Vehicle Safety

Konstantinos Papamichael (CLTC/UC-Davis), Lighting Quality Considerations in Energy Regulations

Maria Nadal (NIST), CIPM and CCPR – What Are These Organizations and How Do They Affect My Testing?

James Leland (Copia LLC), Proposed Terminology for Fluorescence Spectrophotometry

Cameron Miller (NIST), SSL MAP Summary with Analysis of Metadata

Tatsukiyo Uchida (Panasonic Corporation), Research on Adaptation Field Definition for CIE Mesopic Photometry System Installation

Jeff Hulett (Vektrex), Implementation and Comparison of the LM-85 Measurement Methods

Yuqin Zong (NIST), Development of 2 Pi Total Spectral Radiant Flux Standards at NIST

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